White-box Testing by Combining Deduction-based Specification Extraction and Black-box Testing

Begutachtete Veröffentlichung in Tagungsband

Autor(en):Bernhard Beckert und Christoph Gladisch
In:First International Conference on Tests and Proofs (TAP 2007). Revised Papers
Verleger:Springer
Reihe:LNCS
Band:4454
Jahr:2007
DOI:10.1007/978-3-540-73770-4_12

BibTeX

@InProceedings{BeckertGladisch2007,
  author    =    {Bernhard Beckert and Christoph Gladisch},
  title     =    {White-box Testing by Combining Deduction-based Specification Extraction and 
                  Black-box Testing},
  booktitle =    {First International Conference on Tests and Proofs ({TAP} 2007). Revised Papers},
  editor    =    {Bertrand Meyer and Yuri Gurevich},
  publisher =    {Springer},
  place     =    {Z\"urich, Switzerland},
  series    =    {LNCS},
  volume    =    {4454},
  date      =    {February 12-13},
  month     =    feb,
  year      =    {2007},
  doi       =    {10.1007/978-3-540-73770-4_12}
}